Resolving near-field from high order signals of scattering near-field scanning optical microscopy
نویسندگان
چکیده
منابع مشابه
Resolving near-field from high order signals of scattering near-field scanning optical microscopy.
The ability of using scattering-type near-field scanning optical microscopy (s-NSOM) to characterize amplitude and phase of optical near fields was investigated. We employ numerical simulations to compute signals scattered by the tip, using a bowtie nano-aperture as the example, and compare with the data obtained from s-NSOM measurements. Through demodulation of higher order harmonic signals, w...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2014
ISSN: 1094-4087
DOI: 10.1364/oe.22.018715